时刻表
时区：Asia/Shanghai
第3天2021年08月20日星期五
| PS2 |
Keynote 4/5/6@Plenary Session(Openning, Keynotes 1-6)2021年08月20日 09:00~18:00 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-25 11:47:24 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Gang Qu | ||||
| 09:00 | 09:45 | 45 | 7 |
Ratio based Resistive RAM for Low Error Rate, High Energy Efficiency and In-Memory ComputingK-T. Tim Cheng Professor/Hong Kong University of Science and Technology
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| 09:45 | 10:30 | 45 | 8 |
Reliability of Carbon-Nanotube FET Circuits: Today’s Challenges and the Road AheadChakrabarty Krishnendu Professor/Duke University
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| 10:30 | 10:45 | 15 | Coffee break | |
| Session Chairs: Shi-Yu Huang | ||||
| 10:45 | 11:30 | 45 | 9 |
Emerging Need for Fast Thermal and Dynamic Voltage Drop Predictors for the Optimization of Scan/Functional Test PatternsNorman Chang Chief Technologist/ANSYS, Inc
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| RS3 |
A4 Circuit Design and Evaluation with Emerging Technology@Regular Paper Session2021年08月20日 11:30~12:30 ZOOM会议 进入会议室 时刻表 V8 发布时间：2021-08-23 15:03:40 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Qian Wang, Bing Li | ||||
| 11:30 | 11:50 | 20 | 61 |
Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust ComputingAibin Yan Associate professor/Anhui University
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| 11:50 | 12:10 | 20 | 55 |
High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signalsMitsuo Matsumoto Expert Engineer/Advantest Corporation
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| 12:10 | 12:30 | 20 | 52 |
Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal ProbabilityZhen Wang Associate Professor/Shanghai University of Electric Power
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| SS3 |
A5. 3D test and 3D DFT@Special Session2021年08月20日 20:00~21:00 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Vivek Chickermane, Senling Wang | ||||
| 20:00 | 20:20 | 20 | 35 |
3D Test Wrapper Design and Physical OptimizationVivek Chickermane/Cadence Design Systems；Subhasish Mukherjee /Cadence
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| 20:20 | 20:40 | 20 | 36 |
Testing and Fault-Localization Solutions for Monolithic 3D ICsArjun Chaudhuri /Duke University
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| 20:40 | 21:00 | 20 | 37 |
Designing Parallel TAMs for 3D-SICs Based on IEEE Std 1838’s Flexible Parallel Port Leveraging Lessons-Learned on 2D-SOCsErik Jan Marinissen Scientific Director/imec
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| SS4 |
A6. Test Methods Towards Zero Failure Rate for Safety-Critical ICs@Special Session2021年08月20日 21:05~22:25 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Shi-Yu Huang, Dawen Xu | ||||
| 21:05 | 21:25 | 20 | 54 |
TAIWAN Online: Test AI with AN Codes Online for Automotive ChipsTsung-Chu Huang Professor/National Changhua University of Education
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| 21:25 | 21:45 | 20 | 69 |
Integrated Scratch Marker for Wafer Defect DiagnosisKatherine Shu-Min Li/National Sun Yat-Sen University
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| 21:45 | 22:05 | 20 | 65 |
Rigorous Test Flow for PLL to Identify Weak DevicesShi-Yu Huang/National Tsing Hua University
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| 22:05 | 22:25 | 20 | 72 |
AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation HardeningCharles H.-P. Wen Professor/National Yang Ming Chiao Tung University
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| SS5 |
B6 Top Papers of ITC’2020@Special Session2021年08月20日 21:05~22:25 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Haihua Shen, Aibin Yan | ||||
| 21:05 | 21:25 | 20 | 49 |
Characterization, Modeling and Test of SyntheticAnti-FerromagnetFlip Defect in STT-MRAMsWu Lizhou Post Doc./,Delft University of Technology
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| 21:25 | 22:05 | 40 | 43 |
Industrial Application of IJTAG Standards to the Test of Big-A/little-d Devices – plus Updates to the Latest State of IEEE P1687.2Hans Martin von Staudt/DIALOG SEMICONDUCTOR
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| 22:05 | 22:25 | 20 | 44 |
Learning A Wafer Feature with One Training SampleYueling Jenny Zeng/University of California Santa Barbara
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| IS3 |
B4. Diagnosis and Yield Learning@Industrial Session2021年08月20日 11:30~12:30 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-23 15:07:06 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Yu Huang, Wu Yang | ||||
| 11:30 | 11:50 | 20 | 18 |
Diagnosis and Yield LearningRuifeng Guo /Synopsys, USA
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| 11:50 | 12:10 | 20 | 16 |
Advancements in Diagnosis and YieldSameer Chillarige/Cadence
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| 12:10 | 12:30 | 20 | 17 |
Accuracy and scalability of physically aware diagnosis for yield learningWu-Tung Cheng /Siemens Digital Industries Software, USA
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| IS4 |
B5. Industry Practice in SoC and Memory Test@Industrial Session2021年08月20日 20:00~21:00 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-23 15:07:06 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Fan Zhang, Jian Wang | ||||
| 20:00 | 20:20 | 20 | 59 |
An SRAM Test Quality Improvement Method For Automotive chipsTuanhui Xu/employees
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| 20:20 | 20:40 | 20 | 56 |
A Dynamic Memory Maintenance Model Based on Physical ArchitectureShixin Xu/Duke Kunshan Universit
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| 20:40 | 21:00 | 20 | 70 |
SoC Testability and Its Application in Life Cycle ManagementYang Liu FAE/HISILICON
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| CS |
Closing Remark and Best Paper Reward@Closing Remark and Best Paper Reward2021年08月20日 22:30~22:45 ZOOM会议 进入会议室 会议主席：Ying Zhang/Tongji University 时刻表 V3 发布时间：2021-08-20 20:22:58 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Ying Zhang | ||||
| Closing Remarks and Best Paper Award | ||||
| 22:30 | 22:45 | 15 | 73 |
ITC-Asia 2021 Closing Remark & Best Paper AwardYing Zhang/Tongji University；Huawei Li/University of Chinese Academy of Sciences；Peng Zebo/Linkoping University；Rob Knoth/Cadence；Chang Soon-Jjh/National Cheng Kung University
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重要日期
-
会议日期
08月18日
2021
至08月20日
2021
-
05月10日 2021
初稿截稿日期
-
08月16日 2021
提前注册日期
-
08月19日 2021
报告提交截止日期
-
08月20日 2021
注册截止日期
主办单位
Tongji University
Chinese Computer Federation
承办单位
联系方式
- Prof. Zhang Ying
- yi******@tongji.edu.cn
历届会议
-
2022年08月24日 台湾-中国 Taipei
2022 IEEE International Test Conference in Asia -
2019年09月03日 日本 Tokyo
2019 IEEE International Test Conference in Asia -
2018年08月15日 中国
2018 IEEE International Test Conference in Asia -
2017年09月13日 台湾-中国 Taipei
2017 IEEE International Test Conference in Asia -
2014年11月10日 中国 杭州市
IEEE International Test Conference in Asia
