时刻表
时区：Asia/Shanghai
第2天2021年08月19日星期四
| PS1 |
Openning and Keynote 1/2/3@Plenary Session(Openning, Keynotes 1-6)2021年08月19日 09:00~12:00 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-25 11:47:24 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| 09:00 | 09:30 | 30 | 74 |
OpeningYing Zhang/Tongji University
|
| Session Chair: Zebo Peng | ||||
| 09:30 | 10:15 | 45 | 4 |
How to make chip intelligent – from an architecture perspectiveShaojun Wei Professor/Tsinghua University
|
| 10:15 | 10:30 | 15 | Cofee Break | |
| Session Chair: Huawei Li | ||||
| 10:30 | 11:15 | 45 | 5 |
Life-Time Reliability for Memory Devices in AI ChipXinLi Gu Chief Architect Reli/Huawei Technology Co., Ltd.
|
| 11:15 | 12:00 | 45 | 6 |
Towards Robust AI: A Test PerspectiveQiang Xu Associate Professor/The Chinese University of Hong Kong
|
| RS1 |
A1. When Machine Learning Meets Testing and Security@Regular Paper Session2021年08月19日 20:00~20日 21:00 ZOOM会议 进入会议室 时刻表 V8 发布时间：2021-08-23 15:03:40 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Jiliang Zhang, He Li | ||||
| 20:00 | 20:20 | 20 | 51 |
Use Machine Learning Based Smart Sampling to Improve System Level Testing EfficiencyChenwei Liu/Huawei Technology Co., Ltd.
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| 20:20 | 20:40 | 20 | 62 |
The ANN Based Modeling Attack and Security Enhancement of the Double-layer PUFYongliang Chen/Peking University Shenzhen Graduate School
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| 20:40 | 21:00 | 20 | 48 |
Fault Modeling and Testing of Spiking Neural Network ChipsI-Wei Chiu/National Taiwan University；Li James Chien Mo/National Taiwan University
|
| RS2 |
A2. Fault Monitoring, Detecting, and Modeling@Regular Paper Session2021年08月19日 21:05~22:05 ZOOM会议 进入会议室 时刻表 V8 发布时间：2021-08-23 15:03:40 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Zhezhi He, Xueyan Wang | ||||
| 21:05 | 21:25 | 20 | 60 |
Developing Formal Models for Measuring Fault Effects Using Functional EDA ToolsLingjuan Wu Associate Proferssor/,huazhong agricultural university
|
| 21:25 | 21:45 | 20 | 63 |
Automatic Test Program Generation for Transition Delay Faults in Pipelined ProcessorsJiun-Lang Huang Professor/,National Taiwan University
|
| 21:45 | 22:05 | 20 | 58 |
A Duty-Cycle Monitor Supporting A Wide Frequency Range of Clock SignalChen-Lin Tsai/NTHU
|
| SS1 |
B1. Fault Tolerant TSV and Latch Designs@Special Session2021年08月19日 20:00~21:00 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Li Jiang, Zhengfeng Huang | ||||
| 20:00 | 20:20 | 20 | 29 |
A Low-Cost Quadruple-Node-Upset Self-Recoverable Latch DesignYan Wen Student/ChangSha university of science and technology
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| 20:20 | 20:40 | 20 | 50 |
Kelvin Bridge Structure Based TSV Test for Weak FaultsHao Chang/Anhui University of Finance & Economics
|
| 20:40 | 21:00 | 20 | 47 |
A N:1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICsDanqing Li/HeFei University of Technology
|
| SS2 |
A3. Learning based Discovery in ATPG, DfT, and Reverse Engineering@Special Session2021年08月19日 22:10~23:10 ZOOM会议 进入会议室 时刻表 V15 发布时间：2021-08-23 15:03:36 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Tanvir Arafin, Ying Zhang | ||||
| 22:10 | 22:30 | 20 | 45 |
Scalable Parallel Static LearningXiaoze Lin student/Shantou University
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| 22:30 | 22:50 | 20 | 33 |
An optimized DFT technology based on machine learningHan Yang/Nanjing University of Posts and Telecommunications
|
| 22:50 | 23:10 | 20 | 66 |
Identification of Counter Registers through Full Scan ChainQidong Wang/Harbin Institute of Technology, Shenzhen
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| IS1 |
B2. The Advancement of 1149.10@Industrial Session2021年08月19日 21:05~20日 22:05 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-23 15:07:06 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Organizer: Yu Huang, Session Chair: Paul Reuter | ||||
| 21:05 | 21:25 | 20 | 71 |
Requirements of high-speed scan and DFT implementationFu Haitao DFT technical expert/HISILICON
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| 21:25 | 21:45 | 20 | 11 |
Solving test challenges in adopting serial scan for productionEd Seng/Teradyne Inc；Marc Hutner/Teradyne Inc
|
| 21:45 | 22:05 | 20 | 12 |
Bringing 1149.10 to lifeJ-F Cote/Siemens Digital Industries Software；Geir Eide/Siemens Digital Industries Software
|
| IS2 |
B3. Automotive Test and Reliability@Industrial Session2021年08月19日 22:10~20日 23:10 ZOOM会议 进入会议室 时刻表 V10 发布时间：2021-08-23 15:07:06 |
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| 开始 | 结束 | 持续 | 编号 | 标题 |
|---|---|---|---|---|
| Session Chairs: Yu Huang, Ron Press | ||||
| 22:10 | 22:30 | 20 | 13 |
Challenges and case-studies in ensuring automotive quality on nanoscale SOCsDavid Francis/Texas Instruments, USA
|
| 22:30 | 22:50 | 20 | 14 |
Advanced solutions to address automotive test & reliability challengesYervant Zorian/Synopsys
|
| 22:50 | 23:10 | 20 | 15 |
Combining structural and functional monitoring for improving overall safety and reliability of automotive ICsNilanjan Mukherjee/Siemens Digital Industries Software
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重要日期
-
会议日期
08月18日
2021
至08月20日
2021
-
05月10日 2021
初稿截稿日期
-
08月16日 2021
提前注册日期
-
08月19日 2021
报告提交截止日期
-
08月20日 2021
注册截止日期
主办单位
Tongji University
Chinese Computer Federation
承办单位
联系方式
- Prof. Zhang Ying
- yi******@tongji.edu.cn
历届会议
-
2022年08月24日 台湾-中国 Taipei
2022 IEEE International Test Conference in Asia -
2019年09月03日 日本 Tokyo
2019 IEEE International Test Conference in Asia -
2018年08月15日 中国
2018 IEEE International Test Conference in Asia -
2017年09月13日 台湾-中国 Taipei
2017 IEEE International Test Conference in Asia -
2014年11月10日 中国 杭州市
IEEE International Test Conference in Asia
