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656
Effects of different energy proton irradiation on DC characteristics of InP-based HEMT终稿

Yinghui Zhong*

全体主题 > Device and Circuit Reliability

655
High-Performance, All-Inkjet-Printed Light Emitting Diodes Based on Quantum Dots终稿

Shuren Zhang*, Shibo Jiao, Yuanyuan Li, Wei Yuan, Shijie Zhang, Shinsuke Iguchi, Yuan-Chun Wu, Hang Zhou

全体主题 > Optoelectronic Materials and Devices

654
A New dual directional SCR with high holding voltage for High Voltage ESD protection终稿

Shiyu Song*, Feibo Du, Fei Hou, Wenqiang Song, Zhiwei Liu, Jizhi Liu

全体主题 > Device and Circuit Reliability

653
A Low-Quiescent Current Off-Chip Capacitor-less LDO Regulator with UGCC Compensation终稿

peijun Liu, Shengming Huang*, Quanzhen Duan, Qian Zhu, Zhen Meng

全体主题 > Analog Circuits

652
Compact and Compound SCR structure for full chip ESD protection终稿

Xiaoyu Dong*, Feibo Du, Fei Hou, Wenqiang Song, Zhiwei Liu, Jizhi Liu

全体主题 > Device and Circuit Reliability

651
Enhanced LVTSCR with High Holding Voltage in Advanced CMOS technology终稿

Meichen Huang*, Feibo Du, Zhiwei Liu, Jizhi Liu, Fei Hou, Wenqiang Song

全体主题 > Device and Circuit Reliability

650
Low power Resistive Switching Phenomena in Ti/SiN/Au Memory Device终稿

xiaoyi lei, yang dai*, zhiyong zhang, zhuqing liu, junfeng yan, wu zhao

全体主题 > Memory Devices and Technology

649
111摘要待审

yang yang, 12 123*, 12 12

全体主题 > Silicon Devices

648
123摘要待审

yang yang*

全体主题 > Silicon Devices

647
RF Modeling of the 3D Electro-Photonic Integration based on SOI Photonic TSV Interposer终稿

Yan Yang*, Rusli Rusli, Mingbin Yu

全体主题 > Modeling and Simulation Technology

646
A Snapback-free RC-IGBT with Si3N4 Trench and P-type Pillar终稿

Lei Cui*, Bi Jun Zhang, Peng Fei Wu, Li Ma, Ru Liang Zhang, Zhi Bin Zhao

全体主题 > Power Electronics

645
A Novel Highly Reliable 12T SRAM Bitcell Design终稿

Jianwei Jiang*, Dianpeng Lin, Jun Xiao, Shichang Zou

全体主题 > Device and Circuit Reliability

644
A 6.5kV FSRD structure with an epitaxial p buffer and diffused n buffer layers终稿

Cailin Wang*, Pu Li

全体主题 > Silicon Devices

643
Analysis of Dynamic Avalanche Ruggedness of Semi-SJMOS终稿

Cailin Wang*, Su Le

全体主题 > Silicon Devices

642
Analysis of blocking characteristic of 3300V RB-IGBT全文被拒

Ma Li*

全体主题 > Silicon Devices

重要日期

  • 会议日期

    06月12日

    2019

    至

    06月14日

    2019

  • 06月12日 2019

    初稿截稿日期

  • 06月14日 2019

    注册截止日期

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Xi'an University of Technology
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