活动简介

16th IEEE Symp. Defect and Fault Tolerance in VLSI and Nanotechnology Systems DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. The technical sessions of the symposium will be held on October 2-4, 2013, within the scenario of the NYU-Abu Dhabi premises in Washington Square. This year the event will be located in the Greenwich Village (also known as "the Village") in Manhattan, New York.

征稿信息

征稿范围

The Program Committee cordially invites you to participate and submit your contribution to DFT 2011. The conference topics include, but are not limited to, the following: Yield Analysis and Modeling Defect/Fault analysis and models; statistical yield mo
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重要日期
  • 会议日期

    10月02日

    2013

    10月04日

    2013

  • 10月04日 2013

    注册截止日期

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