The 2017 International Symposium on VLSI Design, Automation and Test (2017 VLSI-DAT) will again be held in the Ambassador Hotel, Hsinchu, Taiwan during April 24-27, 2017. Organized by Industrial Technology Research Institute (ITRI) and technically cooperation with the Institute of Electrical and Electronics Engineers (IEEE), the 2017 VLSI-DAT provides excellent opportunities for close interactions between industrial and scientific researchers via presentations and discussions on innovations and achievements related to VLSI design, automation and test.

In 2017, the VLSI-DAT and the VLSI-TSA will be held in the same week with four-day overlap. In response to the need of interactions between the technology and design communities, delegates registered for either 2017 VLSI-DAT or 2017 VLSI-TSA will be able to attend the program of both symposia. Original unpublished papers are solicited. Accepted papers will be submitted for inclusion into IEEE Xplore after being presented in the symposium. 

The 2017 VLSI-DAT and VLSI-TSA will feature three joint plenary sessions, two joint invited sessions and a luncheon talk. Specifically, the 2017 VLSI-DAT technical sessions including 3 plenary talks, 2 industrial sessions, 2 special sessions , 3 parallel tutorials and regular paper presentations. In addition, the Best Paper Award for the 2016 VLSI-DAT Symposium will be presented at the opening of the symposium in 2017, and the Best Paper Award for the 2017 Symposium will again be selected during the conference. More details of the Symposium program will be released in January, 2017.