The 2016 International Symposium on VLSI Design, Automation and Test (2016 VLSI-DAT) will again be held in the Ambassador Hotel, Hsinchu, Taiwan during April 25-27, 2016. Organized by Industrial Technology Research Institute (ITRI) and technically cooperation with the Institute of Electrical and Electronics Engineers (IEEE), the 2016 VLSI-DAT provides excellent opportunities for close interactions between industrial and scientific researchers via presentations and discussions on innovations and achievements related to VLSI design, automation and test. In 2016, the VLSI-DAT and the VLSI-TSA will be held in the same week with three-day overlap. In response to the need of interactions between the technology and design communities, delegates registered for either 2016 VLSI-DAT or 2016 VLSI-TSA will be able to attend the program of both symposia. Original unpublished papers are solicited. Accepted papers will be published by the IEEE and be included in IEEE eXplorer after being presented in the symposium. The 2016 VLSI-DAT and VLSI-TSA will feature three joint plenary sessions, one joint invited session, along with a joint panel discussion and a luncheon talk. Specifically, the 2016 VLSI-DAT technical sessions including 3 plenary talks, 2 industrial sessions, 2 special sessions , 3 parallel tutorials and regular paper presentations. In addition, the Best Paper Award for the 2015 VLSI-DAT Symposium will be presented at the opening of the symposium in 2016, and the Best Paper Award for the 2016 Symposium will again be selected during the conference. More details of the Symposium program will be released in January, 2016.