This year's SELSE workshop features three keynote talks. Bill Dally (Nvidia / Stanford University) will discuss resilience issues for ExaScale systems and some open challenges. Karl Greb (Texas Instruments) will bridge the gap between two domains by helping semiconductor developers understand how silicon errors are considered in current functional safety state-of-the-art. Finally, Tom Pawlowski (Micron) will explore error sources found in the latest generation DRAM and NAND device subsystems and discuss general principles of useful error mitigation methods. A panel discussion with industry experts Norbert Seifert (Intel), Charles Slayman (Cisco), and Vikas Chandra (ARM) will discuss whether all reliability issues have been resolved for late CMOS technologies.