In summary, areas of interest include (but are not limited to):

• Analog Test

• ATE Hardware and Software

• Automatic Test Generation

• Board Test and Diagnosis

• Boundary Scan Test

• Built-In Self-Test (BIST)

• Current-Based Test

• Defect-Based Test

• Delay and Performance Test

• Dependability and Functional Safety

• Design for Test (DfT)

• Design for Manufacturing (DfM)

• Diagnosis and Silicon Debug

• Economics of Test

• Test of Emerging Technologies

• Failure Analysis

• Fault Modeling and Simulation

• Fault Tolerance

• GPU Test

• High-Speed I/O Test

• Low-Power IC Test

• Memory Test and Repair

• MEMS Test

• Microprocessor Test

• Mixed-Signal Test

• Multi-/Many-core Processor Test

• Nanotechnology Test

• On-line Test

• Power Issues in Test

• Reconfigurable System Test

• Reliability

• RF Test

• Security and Trust Issues in Test

• Self-Repair

• Sensor Test

• Signal Integrity Test

• SiP, Stacked, 3D IC Test

• SoC Test

• Soft Errors

• Standards in Test

• Statistical Learning in Test

• Test Compression

• Test Quality

• Test Synthesis

• Thermal Issues in Test

• Validation and Verification

• Variability Issues in Test

• Yield Analysis and Enhancement