活动简介
The International Design and Test Symposium is an IEEE technically co-sponsored event devoted to exploring emerging challenges and new concepts related to the design, test, automation, and reliability of electronic systems ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems. IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test, and reliability held in the Middle East and Africa (MEA) region. The Symposium is initiating in affiliation with the IEEE TTTC (Test Technology Technical Council) and the 2016 edition is organized and sponsored by CES Laboratory and the University of Sfax. It is also technically co-sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English.
征稿信息
重要日期
征稿范围
Topics of interest include but are not limited to:
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Design Methods and Tools
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Test and Reliability
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IP and SOC Design
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Multiprocessor/Multi-core Systems
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Embedded Systems
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DFX
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Analog, Mixed Signal and RF Design
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High Speed Circuits Design
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Design of MEMS and MOEMS
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Low Voltage and Low Power system
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Innovative Technologies
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IoT design
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Simulation, Validation & Verification
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System Specification and Modeling
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Formal Methods and Verification
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System Design/Synthesis/Optimization
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Yield Optimization
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IP and SOC Testing
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Multiprocessor/Multi-Core Systems Test
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Memory & FPGA Test & Repair
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Automotive reliability & test
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High Speed, Analog, Mixed Signal & RF Testing
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MEMS/MOEMS Testing
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Defect and Fault Modeling
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DFT, BIST and BISR
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On-line Testing / Fault Tolerance
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Fault Simulation, ATPG
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Reliability Failures/ Modeling
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Circuit Reliability
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Electronic System Reliability
全部留言
重要日期
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会议日期
12月18日
2016
至12月20日
2016
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11月03日 2016
初稿截稿日期
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12月20日 2016
注册截止日期
留言