The last few years have seen dramatic advances in electron microscope resolution, spatial resolution through aberration correction, energy resolution through monochromation, and time resolution through pulsed sources. New windows are opening into structure / property relations in thin films and nanosystems, and materials dynamics during phase changes and under operating environments. Increasingly large datasets are being generated through pixelated detectors and focal series and new methods of image analysis are becoming increasingly important. This symposium will survey these new emerging frontiers that modern microscopes are now able to explore.