We are delighted to announce that the 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD’09), sponsored by IEEE Circuit and System Society (CAS), will be held on 28th -29th Apr. 2009 in Chengdu P. R. China. Prof. Rueywen Liu, a General Chair of ICTD’09, is a Chair Professor of the University of Notre Dame, a Life Fellow of IEEE, and a former President of IEEE CAS. ICTD’09 will invite a list of distinguished keynote speakers. ICTD’09 invites submissions on the latest techniques for testing and diagnosis on topics that are related but not limited to the following. Submissions should be original, unpublished papers describing recent work. The papers in the proceedings of ICTD’09 are published by IEEE Xplore and indexed by EI and DOI.