For eight decades, the Device Research Conference (DRC) has brought together leading scientists, researchers and students to share their latest discoveries in device science, technology and modeling. Notably, many of the first public disclosures of key device technologies were made at the DRC. This year marks the 82nd anniversary of the DRC—the longest-running device research meeting in the world. The high-caliber technical sessions are highlighted by plenary talks and invited talks by international research pioneers and leaders behind modern electronic technology.
The 2024 Conference will feature:
1.An informative, timely short course in rapidly developing fields
2.Oral and poster presentations on electronic/photonic device experiments and simulations
3.Plenary and invited presentations given by worldwide leaders
4.Evening rump sessions
5.Strong student participation and Student Paper Awards
6.Focus sessions on devices for neuromorphic computing
7.More than 50 invited speakers covering a wide spectrum of devices
DRC will be held in coordination with the Electronic Materials Conference (EMC), which will occur the same week, from June 26-28. This recognizes the strong interaction between device and electronic materials research and provides fruitful exchanges of information between attendees of both Conferences.
Topics to be presented include:
» Devices for Biological and Healthcare
Applications
» Emerging Devices
» Devices for Extreme Conditions
» Spintronic and Magnetic Devices
» Memory Devices
» Modeling and Simulation of Devices
» Nanoscale and Vacuum Devices
» Optoelectronic and Optical Devices
» Power Devices
» Quantum Devices
» Heterogeneously Integrated Devices
» Thin-Film and Flexible Devices
» RF and Terahertz Devices
» Wide-bandgap Device
» 2D Materials and Devices
» Neuromorphic Computing Devices
06月24日
2024
06月26日
2024
摘要截稿日期
注册截止日期
2025年06月22日 美国 Durham
2025 Device Research Conference2017年06月25日 美国 Notre Dame
2017第七十五届设备研究会议2015年06月21日 美国
2015年第73届器件研究会议2014年06月22日 美国
2014年第72届器件研究会议2013年06月23日 美国
2013年第71届电子元件研究会议
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