594 / 2019-03-15 19:28:07
Comparative study of bipolar Resistive Switching and complementary switching behavior of Cu-doped resistive devices
complementary resistive switching (CRS),hybrid conductive filament,Nanocrystal
终稿
quantan wu / Institute of Microelectronics of Chinese Academy of Sciences
jingchen cao / Institute of Microelectronics of Chinese Academy of Sciences
Ling Li / Institute of Microelectronics of Chinese Academy of Sciences
Writam Banerjee / Institute of Microelectronics of Chinese Academy of Sciences
liu ming / Institute of Microelectronics of Chinese Academy of Sciences
Resistive random access memory (RRAM) is a promising candidate for next-generation nonvolatile memory applications. To further understanding the mechanism of the resistive switching behavior is essential. Here, a comparative study of bipolar Resistive Switching and complementary switching behavior was implemented based on the Cu-doped resistive devices. Excellent bipolar resistive switching behavior has been achieved by introducing the NCs into the HfOx oxide. Meanwhile, a highly stable nature of CRS was achieved in W-I device.
重要日期
  • 会议日期

    06月12日

    2019

    06月14日

    2019

  • 06月12日 2019

    初稿截稿日期

  • 06月14日 2019

    注册截止日期

承办单位
Xi'an University of Technology
联系方式
历届会议
移动端
在手机上打开
小程序
打开微信小程序
客服
扫码或点此咨询