583 / 2019-03-15 15:21:21
Influence of p- blocking base carrier lifetime on characteristics of SiC light-triggered thyristor
silicon carbide, light-triggered thyristor, minority carrier lifetime, turn-on delay time
终稿
Liqi An / Xi'an University of Technology
Hongbin Pu / Xi'an University of Technology
Xi Wang / Xi'an University of Technology
Xinyu Tang / Xi'an University of Technology
Qing Liu / Xi'an University of Technology
The influence of p- blocking base carrier lifetime on characteristics of SiC light-triggered thyristor (LTT) is studied by numerical simulation. The results indicate that longer p- blocking base carrier lifetime leads to lower on-state voltage drop. And the effects of p- blocking base minority carrier lifetime on turn-on characteristics of SiC LTT are related to the depletion width of p- blocking base region at different bias voltages. In the same range of p- base lifetime change from 0.13μs to 10μs, the turn-on delay time of the LTT, in which the p- blocking base is not completely depleted, is reduced from 5.52μs to 1.53μs at a forward voltage of 850V. However, the turn-on delay time of the LTT, in which p- blocking base is fully depleted, keeps almost unchanged at the voltages of 1700V and 8500V.
重要日期
  • 会议日期

    06月12日

    2019

    06月14日

    2019

  • 06月12日 2019

    初稿截稿日期

  • 06月14日 2019

    注册截止日期

承办单位
Xi'an University of Technology
联系方式
历届会议
移动端
在手机上打开
小程序
打开微信小程序
客服
扫码或点此咨询