581 / 2019-03-15 14:49:22
University of Electronic Science and Technology of China-luxiaofei@ime.ac.cn-Poster-Not published before
Silicon Carbide, Current Spreading Layer, Insulated Gate Bipolar Transistor,Switching Characteristic
终稿
Xiaofei Lu / University of Electronic Science and Technology of China
Xiaoli Tian / Institute of Microelectronics of the Chinses Academy of Sciences
A ultrahigh voltage p-channel 4H-SiC (Silicon Carbide) IGBT (Insulated Gate Bipolar Transistor) with CSL (Current Spreading Layer) structure is designed and optimized. The static and dynamic characteristics of the IGBT is improved by adjusting the CSL doping concentration NCSL, the CSL thickness DCSL and the width of JFET region LJFET. Through numerical simulations, when NCSL is 1×1016cm−3, DCSL is 1.5μm and LJFET is 3μm, the blocking voltage can reach 15.6kV, and the gate oxide field EOX is less than the critical electric field 3MV/cm. When the on-state current is 10A, the on-state voltage is only 8.2V. The turn-on time is about 120ns and the turn-off time is about 440ns at 5kV dc-link voltage.
重要日期
  • 会议日期

    06月12日

    2019

    06月14日

    2019

  • 06月12日 2019

    初稿截稿日期

  • 06月14日 2019

    注册截止日期

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