420 / 2019-02-26 11:22:35
A 160×120 ROIC with Non-uniformity Calibration for Silicon Diode Uncooled IRFPA
ROIC,Uncooled IRFPA,Silicon Diode,NUC,Low-noise DAC,Blind Pixel
终稿
YAJUN ZHU / Key Laboratory of Microelectronic Devices and Circuits, Peking University
YUZE NIU / Key Laboratory of Microelectronic Devices and Circuits, Peking University
WENGAO LU / Key Laboratory of Microelectronic Devices and Circuits, Peking University
ZHAOFENG HUANG / Key Laboratory of Microelectronic Devices and Circuits, Peking University
YACONG ZHANG / Key Laboratory of Microelectronic Devices and Circuits, Peking University
ZHONGJIAN CHEN / Key Laboratory of Microelectronic Devices and Circuits, Peking University
This paper presents a ROIC (Readout Integrated Circuit) with NUC (Non-uniformity Calibration), which is applied in a silicon diode uncooled IRFPA (Infrared Focal Plane Array). We propose blind pixel to calibrate chip temperature non-uniformity and DAC-based calibration for calibrating process non-uniformity. The ROIC is fabricated using a 0.35μm CMOS process with array size of 160×120. Power consumption of the ROIC is 41mW, noise of the DAC is less than 2μV, and the circuit’s SNR (Signal-to-Noise Ratio) is 72dB.
重要日期
  • 会议日期

    06月12日

    2019

    06月14日

    2019

  • 06月12日 2019

    初稿截稿日期

  • 06月14日 2019

    注册截止日期

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