417 / 2019-02-26 10:38:29
Polarization measurement method of semiconductor laser
collimation,polarized beam splitter,wave plate,semiconductor laser
终稿
Qingmin Li / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Kechang Song / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Huanhuan Zhang / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Zhanqiang Ren / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Cheng Sun / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
Yongchao Zhao / Xi'an Lumcore Optoelectronics Technologies Co., Ltd
In this paper, the polarization degree of semiconductor laser device in COS package form is measured according to the principle of collimation lens, the light characteristics of polarized beam splitter and the characteristics of wave plate can change the polarization state of laser beam, and the device and measurement method of measuring system for polarization degree of 808nm semiconductor laser device are described, and the purpose of the polarization test and the factors affecting the polarization degree.
重要日期
  • 会议日期

    06月12日

    2019

    06月14日

    2019

  • 06月12日 2019

    初稿截稿日期

  • 06月14日 2019

    注册截止日期

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