370 / 2019-01-14 20:55:30
A Non-Ohmic Normally-off GaN RB-MISHEMT Featuring a Gate-Controlled Schottky Tunnel Junction
MISHEMTs, Schottky tunnel barrier, tunneling probability, reverse blocking
终稿
Liu Xiyuan / 电子科技大学
宜军 施 / 电子科技大学
Chen Wanjun / 电子科技大学
WU Shan / Tianfu College of Southwest University of Finance and Economics
Tangsheng Chen / Science and Technology on Monolithic Integrated Circuits and Modules Laboratory
A non-Ohmic normally-off GaN reverse blocking metal-insulator-semiconductor high electron mobility transistors (RB-MISHEMTs) with a MIS field-effect Schottky tunnel junction at source electrodes is proposed for the first time. The device exhibits normally-off operation by virtue of the thick source’s Schottky tunnel barrier, whose effective width is controlled by the insulated gate next to Schottky-structure source. A positive gate bias can reduce the barrier width and subsequently enhance the tunneling probability, while a zero gate bias results in a thick barrier which can effectively suppress the tunnelling current. The Schottky-structure drain with gated edge termination enables the device with reverse blocking capability and low reverse leakage current. The proposed device delivers a low off-state leakage current of 1μA/mm and a low onset voltage of 0.6 V at same time. Moreover, the absence of Au-based Ohmic process and high temperature annealing process enables the proposed device with CMOS compatibility and low thermal budget.
重要日期
  • 会议日期

    06月12日

    2019

    06月14日

    2019

  • 06月12日 2019

    初稿截稿日期

  • 06月14日 2019

    注册截止日期

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