The 2nd International Workshop on Biometrics in the Wild 2017 (BWild 2017) will be held in conjunction with a IEEE FG 2017 on June 3, 2017 (TBD) in Washington DC, USA. BWild 2017 builds on the success of the 2015 Workshop on Biometrics in the Wild that was held in conjunction with IEEE FG 2015. The goal of the workshop is to present the most recent and advanced work related to biometric recognition in unconstrained seetings (often referred to as »biometric recognition in the wild«) and bring together researchers and practitioners working in this area. Topics of interest include all parts of biometric systems ranging from detection, segmentation, landmark localization, pre-processing, and feature extraction techniques to modeling and classification approaches capable of operating on biometric data captured in the wild. New methodologies, architectures and studies related to deep learning and applied to problems related to unconstrained biometrics are also welcome.