As it happens with design automation, Analog and Mixed-Signal test solutions are much less generic than their siblings from the digital world. In spite of the high costs associated to specification-based test, the industry seemed reluctant to invest in alternatives. Why would we change something that worked? But with the rise of safety-critical applications, reliability requirements are increasing and quality is nowadays a strong asset in competitive markets. Specification-based test cannot be considered perfect any longer. The golden reference is shattered and this is an opportunity for the Analog and Mixed-Signal test community.
The International Mixed-Signals Testing Workshop is a forum that brings together this community to discuss ideas and views on the following topics, among others:
Test generation
Fault modeling and simulation
Test metrics estimation
Self-healing and self-adaptation
Built-in self-test
Design-for-test
Fault diagnosis
Failure analysis
Defect characterization
ATE technology
Economics of test and yield optimization
On-line test
Fault tolerance
Reliability and design-for-reliability
07月03日
2017
07月05日
2017
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