活动简介

As it happens with design automation, Analog and Mixed-Signal test solutions are much less generic than their siblings from the digital world. In spite of the high costs associated to specification-based test, the industry seemed reluctant to invest in alternatives. Why would we change something that worked? But with the rise of safety-critical applications, reliability requirements are increasing and quality is nowadays a strong asset in competitive markets. Specification-based test cannot be considered perfect any longer. The golden reference is shattered and this is an opportunity for the Analog and Mixed-Signal test community.

征稿信息

重要日期

2017-04-28
初稿截稿日期
2017-05-15
初稿录用日期
2017-06-02
终稿截稿日期

征稿范围

The International Mixed-Signals Testing Workshop is a forum that brings together this community to discuss ideas and views on the following topics, among others:

  • Test generation

  • Fault modeling and simulation

  • Test metrics estimation

  • Self-healing and self-adaptation

  • Built-in self-test

  • Design-for-test

  • Fault diagnosis

  • Failure analysis

  • Defect characterization

  • ATE technology

  • Economics of test and yield optimization

  • On-line test

  • Fault tolerance

  • Reliability and design-for-reliability

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重要日期
  • 会议日期

    07月03日

    2017

    07月05日

    2017

  • 04月28日 2017

    初稿截稿日期

  • 05月15日 2017

    初稿录用通知日期

  • 06月02日 2017

    终稿截稿日期

  • 07月05日 2017

    注册截止日期

主办单位
IEEE Council on Electronic Design Automation
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