The metal material secondary electron emission modification technology has important research significance and broad application prospects in particle accelerators, spacecraft, electron multiplier devices, electric vacuum devices and other fields. Ion beam irradiation is a modification method with great application potential. In this paper, the changes of secondary electron emission characteristics of common metal materials such as copper and stainless steel under different surface morphology, internal defects and ion implantation are simulated by Monte Carlo method under the simplified irradiation effect model. The results show that surface pit defects are a significant factor to inhibit the secondary electron emission yield of metal materials, which can be reduced by more than 70%, while surface peak morphology can enhance the secondary electron emission coefficient, which can be increased by more than 60%. The suppression effect of internal defects on secondary electron emission is relatively weak, only about 13%. The inhibition effect of ion implantation will only be effective in the shallow surface layer (about 0.5nm), which is similar to plating a film with low emissivity on the metal surface. The research results provide guidance for the design of ion beam irradiation modification technology for secondary electron emission characteristics of metal materials.

ion beam irradiation, secondary electron emission modification, surface morphology, internal defects, ion implantation