130 / 2023-09-20 20:26:49
Embedding to Metric Model for Few-Shot Cross-Domain Fault Diagnosis
cross-domain fault diagnosis, few-shot learning, meta-learning framework, metric
终稿
Jiale Kai / Soochow University
Jun Wang / Soochow University
Changqing Shen / Soochow University
Juanjuan Shi / Soochow University
Zhongkui Zhu / Soochow University
Few-shot fault diagnosis aims to address the issue of data scarcity in fault diagnosis. Pioneering studies typically employ meta-learning frameworks due to their elegant formalization and effective properties. However, this structure will also increase the complexity of model training and limit the design of the model. Surprisingly, a new perspective is that models in which meta-train algorithms and meta-test algorithms that are completely uncorrelated can outperform all meta-learning methods. Building on this line of inquiry, we propose a novel model termed Embedding to Metric (E2M), with a new framework for cross-domain few-shot fault diagnosis. In this new framework, the meta-train algorithm focuses on obtaining good embeddings to leverage the metric in the meta-test. Finally, we evaluate the proposed model on a public dataset, demonstrating that our framework outperforms state-of-the-art algorithms with complex structures. This result confirms the viability of the new framework and may contribute to a better understanding of the relationship between few-shot fault diagnosis and other fields, such as fault feature learning and transfer learning.
重要日期
  • 会议日期

    11月02日

    2023

    11月04日

    2023

  • 12月15日 2023

    初稿截稿日期

  • 12月20日 2023

    注册截止日期

主办单位
IEEE Instrumentation and Measurement Society
Xidian University
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