636 / 2022-03-30 22:04:33
学生
Vacuum degree detection,Laser induced plasma
终稿
Wei Ke / Xi'an Jiaotong University
Minyuan Chen / Xi'An Jiaotong University
Youpeng Zhang / Technology Center, PingGao Group Co., Ltd
Huan Yuan / Xi'An Jiaotong University
Aijun Yang / Xi’an Jiaotong University
dingxin Liu / Xi‘an Jiaotong University
xiaohua Wang / Xi'an Jiaotong University
Mingzhe Rong / Xi'an Jiaotong University
Purpose/Aim

Vacuum switch is a kind of green and pollution-free switching equipment. Its insulation depends on the vacuum degree of the vacuum interrupter, and existing means cannot achieve reliable online monitoring. A vacuum degree detection method based on laser-induced plasma imaging is proposed.

Experimental/Modeling methods

As shown in fig.1, the pulse laser passes through mirror 1, dichromatic mirror 1, dichromatic mirror 2, reflecting mirror 2, focusing lens is focused on the shielding of the vacuum interrupter to induce the plasma. The plasma is imaged on ICCD by focusing lens, reflector 2, dichromatic mirror 2, and imaging lens. ICCD takes plasma images at preset parameters. The integral of plasma radiation intensity is calculated by plasma images, and the vacuum degree is extracted from the relationship between the integral radiation intensity and vacuum degree.

Results/discussion

Fig. 2 is the images of plasma obtained by ICCD at 1 Pa, 10-1 Pa, 10-2 Pa, 10-3 Pa, and the images have been normalized. It can be seen from fig.2 that the radiation intensity of plasma decreases monotonously with increasing air pressure. Fig.3 is the fitting diagram of the radiation intensity integral, the radiation intensity integral fits well with the log10(P) (P is air pressures), and the fitting coefficient R-square reaches 0.99472.

Conclusions

The detection method of vacuum degree of vacuum switch dased on laser-induced plasma imaging can realize vacuum detection, the detection limit is 10-4 Pa, far lower than the critical failure vacuum degree of vacuum interrupter.

Appendix (Figure, table, image…)

                                

Fig.1. Schematic diagram of the device structure      Fig.2. Pictures of plasma at different pressures   Fig.3. Radiation intensity fitting diagram

 
重要日期
  • 会议日期

    09月25日

    2022

    09月29日

    2022

  • 08月15日 2022

    提前注册日期

  • 09月10日 2022

    报告提交截止日期

  • 11月10日 2022

    注册截止日期

  • 11月30日 2022

    初稿截稿日期

  • 11月30日 2022

    终稿截稿日期

主办单位
IEEE DEIS
承办单位
Chongqing University
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