198 / 2022-03-14 17:17:36
Study on the Breakdown Characteristics of Metallized Film under AC/DC Superimposed Voltage
Metallized film; DC-link capacitor; DC-AC composite voltage; breakdown
终稿
Guohao Zhang / Huazhong University of Science and Technology
Hua Li / Huazhong University of Science and Technology
Haobo Li / Huazhong University of Science and Technology
Fuchang Lin / Huazhong University of Science and Technology
Qin Zhang / Huazhong University of Science and Technology
Yan Wang / Huazhong University of Science and Technology
Xingang Yang / State Grid Shanghai Municupal Electric Power Company
Purpose/Aim

Owing to the advantage of high reliability, metallized film capacitors are widely used in DC-link applications withstanding DC/AC superimposed voltage. Therefore, it is necessary to study the breakdown characteristics of metallized films under DC/AC superimposed voltage to evaluate the insulating properties of capacitors accurately.

Experimental/Modeling methods

Two overlapping metallized films are used to be the test sample. The DC/AC superimposed voltage with increasing amplitude is applied on the film until the film breaks down. An oscilloscope is used to record the voltage and current waveforms.

Results/discussion

The breakdown field strength of the metallized film hardly changes with k when the AC/DC voltage ratio k < 1, but decreases significantly with the increase of k when k > 1.The breakdown mainly occurs on the rising edge before the peak of AC voltage and keeps approaching the peak as k increases.

Conclusions

The main factor that causes the breakdown of the metallized film is the voltage peak rather than the voltage change rate. When the AC/DC voltage ratio is less than 1, the DC voltage can be used to evaluate the operating performance of the capacitor based on the peak equivalent principle.
重要日期
  • 会议日期

    09月25日

    2022

    09月29日

    2022

  • 08月15日 2022

    提前注册日期

  • 09月10日 2022

    报告提交截止日期

  • 11月10日 2022

    注册截止日期

  • 11月30日 2022

    初稿截稿日期

  • 11月30日 2022

    终稿截稿日期

主办单位
IEEE DEIS
承办单位
Chongqing University
移动端
在手机上打开
小程序
打开微信小程序
客服
扫码或点此咨询