169 / 2022-03-14 15:20:53

Simulation study on electric field variation under metal tip defects in GIS chamber

Gas Insulated switchgear,Metal tip defects,Electric field strength,Finite element

Purpose/Aim

Metal tip defects are typical insulation defects in gas insulated switchgear (GIS), which can distort the electric field in the GIS chamber, thus affecting the insulation performance of SF₆. In order to study the distribution of the electric field change of GIS chamber when metal tip defects exist in GIS busbar, a three-dimensional simulation model of GIS based on finite elements is established this papersoftware. And cones are used as metal tip defects to simulate the actual operating environment of GIS.

Experimental/Modeling methods

By changing the position, sharpness, size and needle tip distribution direction of the metal tip, the influences of different conditions on the electric field strength and electric field non-uniformity of GIS chamber are analyzed.

Results/discussion

The results show that the metal tip is easier to distort the electric field on the high voltage side than low voltage side of the GIS bus; Sharpness changes electric field strength more than size; Changing the angle between the needle tip and the conductor has a great influence on the non-uniformity around the electric field.

Conclusions

This paper enriches the database of GIS insulation defects through simulation, and provides ideas for the detection and early warning of such faults.