419 / 2019-02-28 22:45:02

Study on reflection zone plate diffraction property and its application for ICF

reflection zone plate; hohlraum; soft X-ray; raytracing; X-LAB

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The elliptical reflection zone plate is a kind of optical element for x-ray application and has focusing, dispersion properties. This optic has the advantages of focusing limitation size and fabrication difficulty used for hard X-ray, compared with the transmission zone plate (FZP). It is fabricated on a bulk substrate and does not have much difficulty in the fabrication process. We developed scalar diffraction and raytracing methods to simulate the designed reflection zone plate diffraction properties. The simulation results verified and demonstrated the focusing and dispersion properties of reflection zone plate for the well aligned mount. In addition, a pulse soft X-ray calibration system for hohlraum spectrum analysis is designed and analyzed using the raytracing tool, X-LAB. The elliptical reflection zone plate also has potential applications in investigating x-ray fluorescence spectra and other fields.