65 / 2018-12-04 21:43:58
Mechanism of Electric Field Control at the Interface of the Central Conductor and Insulation Basin of UHV GIS Spacer
UHV; GIS spacer; electric field strength; interfacial coating material
终稿
DeYi Wang / Xi'an University of Technology
Lang Zhao / Xi'an University of Technology
Chuang Wang / Xi'an University of Technology
Yang Li / PetroChina Changqing Oilfield Company
Jing Jia / Xi'an University of Technology
Qing Sun / Xi'an University of Technology
ZongRen Peng / Xi’an Jiaotong University
UHV GIS spacer is an important component in gas-insulated enclosed switchgear (GIS), and its reliability plays a vital role in the safe and stable operation of power system. Due to the differences of the electrical properties between the central conductor and basin insulation material, the interface formed by the two materials becomes the electric field strength concentration region of the spacer. During the process of operation, the ablation damage arising from the interface occurs, which is caused by partial discharge at the interface. Therefore, it is necessary to study the electric field strength concentration effect at the interface of the spacer. And the electric field strength at the interface was taken as the research object in this paper. The reason why the electric field strength at the interface of the spacer is so concentrated was analyzed by finite element simulation. The method of coating the interfacial material was used to suppress the interfacial electric field concentration effect after discussion. Then the model of the spacer that coated with interfacial material was established, and the relationship between the electric field strength on both sides of the interfacial coating materials and the parameters relating to the coating material was derived. Combined with the established model and simulation, the variation of the maximum electric field strength on both sides of the interfacial layer with the dielectric parameters and the coating thickness was analyzed when there are no defects and small defects such as small burrs and small bumps at the interface. The simulation results verified the validity of the established model.
重要日期
  • 会议日期

    04月07日

    2019

    04月10日

    2019

  • 04月10日 2019

    注册截止日期

  • 05月12日 2019

    初稿截稿日期

主办单位
IEEE电介质和电气绝缘协会
中国电工学会工程电介质专业委员会
承办单位
华南理工大学
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